Digital Logic Testing and Simulation von Miczo, A.: Acceptable Paperback (1988)

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Bestandsnummer des Verk�ufers ERICA829047161307X2

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Bibliografische Details

Titel: Digital Logic Testing and Simulation
Verlag: John Wiley and Sons Ltd
Erscheinungsjahr: 1988
Sprache: Englisch
ISBN-10: 047161307X
ISBN-13: 9780471613077
Einband: Paperback
Zustand: Acceptable
Buchtyp: book

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Inhaltsangabe

Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.

Rese�a del editor

Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.

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