Digital Systems Testing and Testable Design

Miron Abramovici

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Verlag: Wiley-IEEE Press, 1994

Beschreibung

Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Bestandsnummer des Verkäufers M00780310624-V

Bibliografische Details

• Titel: Digital Systems Testing and Testable Design
• Verlag: Wiley-IEEE Press
• Erscheinungsjahr: 1994
• Sprache: Englisch
• ISBN-10: 0780310624
• ISBN-13: 9780780310629
• Einband: Hardcover
• Zustand: very good

Über diesen Titel

Inhaltsangabe

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Über die Autorin bzw. den Autor

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.