This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

�ber die Autorin bzw. den Autor

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Anbieterinformationen

Zur Homepage des Verk�ufers

Unternehmensdaten des Verk�ufers

Edward Bowditch Ltd
Exstowe, Exton, Exeter, EX3 0PP, United Kingdom

Gesch�ftsbedingungen und Versandinformationen

Verkaufsbedingungen

Legal entity name: Edward Bowditch Ltd
Legal entity form: Limited company
Business correspondence address: Exstowe, Exton, Exeter, EX3 0PP
Company registration number: 04916632
VAT registration: GB834241546
Authorised representative: Mr. E. Bowditch