ESD Protection Challenges | FinFET Technology and RF CMOS Circuits

Steven Thijs (u. a.)

ISBN 10: 3838336429 / ISBN 13: 9783838336428

Verlag: LAP LAMBERT Academic Publishing, 2010

ESD Protection Challenges | FinFET Technology and RF CMOS Circuits | Steven Thijs (u. a.) | Taschenbuch | 272 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838336428 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. Bestandsnummer des Verkäufers 101284164

Inhaltsangabe:

Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) applications to operate at higher RF frequencies and wider bandwidths, adequate ESD protection needs to be developed without compromising RF performance. This book, therefore, provides an in-depth analysis on ESD protection structures and concepts, implemented in silicon on insulator FinFET technology. Complex dependencies are found for the different ESD performance parameters on both device geometry and process technology. Further, in this book, novel RF-ESD protection solutions are proposed for both narrow- and wideband RF CMOS circuits in most advanced CMOS technologies, with a special emphasis towards CDM protection. This analysis should provide fundamental understanding of the ESD challenges for FinFET technology and RF CMOS circuits, and should be especially useful to everyone working with ESD in the field of product development, support, research or education.

Über die Autorin bzw. den Autor: Steven Thijs, PhD: Studied Civil Electrotechnical Engineering at Katholieke Universiteit Leuven. Senior Researcher at imec, Leuven, Belgium. Guido Groeseneken, PhD: Fellow at imec, Leuven, Belgium. Also professor at Katholieke Universiteit Leuven.

Bibliografische Details

Titel: ESD Protection Challenges | FinFET ...
Verlag: LAP LAMBERT Academic Publishing
Erscheinungsdatum: 2010
Einband: Taschenbuch
Zustand: Neu