Embedded Memory Design for Multi-Core and Systems on Chip

Baker Mohammad

ISBN 10: 146148880X / ISBN 13: 9781461488804

Verlag: Springer-Verlag New York Inc., 2013

Beschreibung

This item is printed on demand. New copy - Usually dispatched within 5-9 working days 393. Bestandsnummer des Verkäufers C9781461488804

Bibliografische Details

Titel: Embedded Memory Design for Multi-Core and ...

Verlag: Springer-Verlag New York Inc.

Erscheinungsdatum: 2013

Einband: Hardback

Zustand: New

Über diesen Titel

Inhaltsangabe:

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

Von der hinteren Coverseite:

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

· Provides a comprehensive overview of embedded memory design and associated challenges and choices;

· Explains tradeoffs and dependencies across different disciplines involved with multi-core and system on chip memory design;

· Includes detailed discussion of memory hierarchy and its impact on energy and performance;

· Uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.