Energy-Efficient Fault-Tolerant Systems (Embedded Systems)

. Ed(s): Mathew, Jimson; Shafik, Rishad A.; Pradhan, Dhiraj K.

ISBN 10: 1493945513 / ISBN 13: 9781493945511

Verlag: Springer, 2016

Beschreibung

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Editor(s): Mathew, Jimson; Shafik, Rishad A.; Pradhan, Dhiraj K. Num Pages: 349 pages, 81 black & white illustrations, 51 colour illustrations, 41 black & white tables, biograp. BIC Classification: PHV; THX; TJFC; TJFD5; TJFN; TTB. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 19. Weight in Grams: 539. . 2016. Softcover reprint of the original 1st ed. 2014. Paperback. . . . . Books ship from the US and Ireland.

Bestandsnummer des Verkäufers V9781493945511

Bibliografische Details

• Titel: Energy-Efficient Fault-Tolerant Systems (Embedded Systems)
• Verlag: Springer
• Erscheinungsjahr: 2016
• Sprache: Englisch
• ISBN-10: 1493945513
• ISBN-13: 9781493945511
• Einband: Softcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Von der hinteren Coverseite

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.