Energy-Efficient Fault-Tolerant Systems

Jimson Mathew

ISBN 10: 1461441927 / ISBN 13: 9781461441922

Verlag: Springer New York, Springer New York, 2013

Beschreibung

Druck auf Anfrage Neuware - Printed after ordering - This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Bestandsnummer des Verkäufers 9781461441922

Bibliografische Details

• Titel: Energy-Efficient Fault-Tolerant Systems
• Verlag: Springer New York, Springer New York
• Erscheinungsjahr: 2013
• Sprache: Englisch
• ISBN-10: 1461441927
• ISBN-13: 9781461441922
• Einband: Buch
• Zustand: Neu
• Abmessungen: 241B x 160 H x 24 T Millimeter Breite: 241 mm, Höhe: 160 mm, Tiefe: 24 mm
• Gewicht: 694 Gramm

Über diesen Titel

Inhaltsangabe

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Von der hinteren Coverseite

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.