Titel: Foundations of Measurement Volume II: Geometrical, Threshold, and ProbabilisticRepresentations: 2 (Dover Books on Mathematics)
Verlag: Dover Publications Inc. 2009-01-01
Erscheinungsjahr: 2009
Sprache: Englisch
ISBN-10: 0486453154
ISBN-13: 9780486453156
Einband: Paperback
Zustand: New

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Inhaltsangabe

A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.

�ber die Autorin bzw. den Autor

David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.

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