High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test

R. Dean Adams

ISBN 10: 1402072554 / ISBN 13: 9781402072550

Verlag: Springer US, Springer US, 2002

Beschreibung

Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Bestandsnummer des Verkäufers 9781402072550

Bibliografische Details

• Titel: High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
• Verlag: Springer US, Springer US
• Erscheinungsjahr: 2002
• Sprache: Englisch
• ISBN-10: 1402072554
• ISBN-13: 9781402072550
• Einband: Buch
• Zustand: Neu

Über diesen Titel

Inhaltsangabe

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Críticas

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)