High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)

Adams, R. Dean

ISBN 10: 1402072554 / ISBN 13: 9781402072550

Verlag: Springer, 2002

Beschreibung

Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!

Bestandsnummer des Verkäufers S_409199676

Bibliografische Details

• Titel: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing, 22A)
• Verlag: Springer
• Erscheinungsjahr: 2002
• Sprache: Englisch
• ISBN-10: 1402072554
• ISBN-13: 9781402072550
• Einband: hardcover
• Zustand: Very Good

Über diesen Titel

Inhaltsangabe

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Críticas

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)