Integrated Circuit Test Engineering : Modern Techniques

Grout, Ian A.

ISBN 10: 1846280230 / ISBN 13: 9781846280238

Verlag: Springer, 2005

Bestandsnummer des Verkäufers 3510153-n

Inhaltsangabe:

Taking a three-pronged approach – test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing.

The text incudes:

• Worked examples and exercises, well-organized references and bibliography.

• An introduction to the use of various software and languages such as MATLAB^®, Spice, Verilog^®-HDL and VHDL.

• A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs.

This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.

Über die Autorin bzw. den Autor:

Doctor Ian Grout is a lecturer within the Department of Electronic and Computer Engineering at the University of Limerick. His research interests include microelectronic circuit design, control systems applications, design for test (digital and mixed-signal), test technology, CAD tool development and interfacing. He currently teaches microelectronic circuit design for electronic engineering students and test engineering for the final year electronic systems and VLSI Masters students. He is also the course leader for the Electronic Systems undergraduate programme within the university.

Doctor Grout has previously held positions with the UK Ministry of Defence and Defence Research Agency. He is currently the chair of the Educational ECAD (Electronic Computer Aided Design) User Group, UK, http://www.eeug.org.uk.

Bibliografische Details

Titel: Integrated Circuit Test Engineering : Modern...
Verlag: Springer
Erscheinungsdatum: 2005
Einband: Softcover
Zustand: New