Interconnect Noise Optimization in Nanometer Technologies

Elgamel, Mohamed; Bayoumi, Magdy

ISBN 10: 0387258701 / ISBN 13: 9780387258706

Verlag: Springer-Verlag New York Inc., 2005

Beschreibung

Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. This title provides insight & intuition into layout analysis and optimization for interconnect in high speed, and high complexity integrated circuits. Num Pages: 137 pages, biography. BIC Classification: TJFC; UGC; UK. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 409. . 2005. Hardback. . . . .

Bestandsnummer des Verkäufers V9780387258706

Bibliografische Details

• Titel: Interconnect Noise Optimization in Nanometer Technologies
• Verlag: Springer-Verlag New York Inc.
• Erscheinungsjahr: 2005
• Sprache: Englisch
• ISBN-10: 0387258701
• ISBN-13: 9780387258706
• Einband: Hardcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnect

Provides insight & intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits

Von der hinteren Coverseite

Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.

The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered.