Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces

Sascha Sadewasser

ISBN 10: 3642271138 / ISBN 13: 9783642271137

Verlag: Springer, Springer, 2013

Beschreibung

Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Bestandsnummer des Verkäufers 9783642271137

Bibliografische Details

• Titel: Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
• Verlag: Springer, Springer
• Erscheinungsjahr: 2013
• Sprache: Englisch
• ISBN-10: 3642271138
• ISBN-13: 9783642271137
• Einband: Taschenbuch
• Zustand: Neu
• Abmessungen: 235B x 155 H x 19 T Millimeter Breite: 235 mm, Höhe: 155 mm, Tiefe: 19 mm
• Gewicht: 528 Gramm

Über diesen Titel

Inhaltsangabe

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Von der hinteren Coverseite

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.