Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.

�ber die Autorin bzw. den Autor

Hideo Fujiwara is an associate professor in the Department of Electronics and Communication, Meiji University.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Anbieterinformationen

We carry a wide selection of books from South Asia, United States, UK.

Zur Homepage des Verk�ufers

Unternehmensdaten des Verk�ufers

Readingos GmbH
Kaiserstra�e 47, Frankfurt am Main, 60329, Germany

Gesch�ftsbedingungen und Versandinformationen

Verkaufsbedingungen

Versandbedingungen

To ensure faster delivery, books may be shipped from any of the following locations; Germany, the United Kingdom (UK), the United States (US),based on the buyer's address and product availability.

Impressum & Info zum Verk�ufer