Manual of Patent Examining Procedure (Vol.3) (Paperback)

U.S. Department of Commerce

ISBN 10: 1452800502 / ISBN 13: 9781452800509

Verlag: Createspace Independent Publishing Platform, 2010

Beschreibung

Paperback. New 9th Edition is available (ISBN: 978-1500927547). This is Original 8th Edition (Rev, July 2008) Manual of Patent Examining Procedure (a.k.a. MPEP) This Manual is published to provide U.S. Patent and Trademark Office (USPTO) patent examiners, applicants, attorneys, agents, and representatives of applicants with a reference work on the practices and procedures relative to the prosecution of patent applications before the USPTO. It contains instructions to examiners, as well as other material in the nature of information and interpretation, and outlines the current procedures which the examiners are required or authorized to follow in appropriate cases in the normal examination of a patent application. Kentaro Sato (Editor) Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Bestandsnummer des Verkäufers 9781452800509

Bibliografische Details

• Titel: Manual of Patent Examining Procedure (Vol.3) (Paperback)
• Verlag: Createspace Independent Publishing Platform
• Veröffentlichungsdatum: 2010
• Sprache: Englisch
• ISBN-10: 1452800502
• ISBN-13: 9781452800509
• Bindung: Paperback
• Zustand: new

Über diesen Titel

Inhaltsangabe

New 9th Edition is available (ISBN: 978-1500927547). This is Original 8th Edition (Rev, July 2008) Manual of Patent Examining Procedure (a.k.a. MPEP) This Manual is published to provide U.S. Patent and Trademark Office (USPTO) patent examiners, applicants, attorneys, agents, and representatives of applicants with a reference work on the practices and procedures relative to the prosecution of patent applications before the USPTO. It contains instructions to examiners, as well as other material in the nature of information and interpretation, and outlines the current procedures which the examiners are required or authorized to follow in appropriate cases in the normal examination of a patent application. Kentaro Sato (Editor)