Materials Science and Technology: A Comprehensive Treatment (Volume 2A) - Characterization of Materials, Part 1

Cahn, RW et al (eds)

ISBN 10: 3527268154 / ISBN 13: 9783527268153

Verlag: VCH, 1992

Volume 2A. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:3527268154. Bestandsnummer des Verkäufers 9765557

Inhaltsangabe:

The first book of a two-part volume dealing with the methods of characterizing metals, ceramics, polymers and related materials. <br> <br> From the Contents:<br> Amelinckx: Electron Diffraction and Transmission Electron Microscopy. Hall: Analytical Electron Microscopy. Joy: Scanning Electron Microscopy. Snyder: X-Ray Diffraction. Telle/Petzow: Light Optical Microscopy. Keliher/Skelly Frame: Atomic Spectrometry. Gallagher: Thermoanalytical Methods. Gerson/Halfpenny/Pizzini/Ristic/Roberts/Sheen/Sherwood: Application of Synchrotron X-Radiation to Problems in Materials Science. Jenkins: X-Ray Fluorescence Analysis. Williams: Polymer Molecular Structure Determination.

Von der hinteren Coverseite: Materials Science and Technology A Comprehensive Treatment Edited by R.W. Cahn, P. Haasen, E.J. Kramer The 18 volume series "Materials Science and Technology" is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2A: This is the first of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers and ceramics. Topics included are: electron diffraction and transmission electron microscopy ? analytical electron microscopy ? scanning electron microscopy ? X-ray diffraction ? light optical microscopy ? atomic spectroscopy ? thermoanalytical methods ? application of synchrotron X-radiation to problems in materials science ? X-ray fluorescence analysis ? polymer molecular structure determination.

Bibliografische Details

Titel: Materials Science and Technology: A ...
Verlag: VCH
Erscheinungsdatum: 1992
Einband: Hardcover
Zustand: Fair