Mechanics of Solder Alloy Interconnects (Electrical Engineering). Dieser Artikel ist nicht verfügbar.
Sprache: Englisch
Verlag: Springer, 1993
- Hardcover
- Neu

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Artikelbeschreibung des Verkäufers
In English.
Bestandsnummer des Verkäufers ria9780442015053_new
- Titel
- Mechanics of Solder Alloy Interconnects (Electrical Engineering)
- Autor
- Frear, Darrel R.; Burchett, Steven N.; Morgan, Harold S.; Lau, John H.
- Verlag
- Springer
- Erscheinungsjahr
- 1993
- Zustand
- New
- Einband
- Hardcover
- Sprache
- Englisch
- ISBN-10
- 0442015054
- ISBN-13
- 9780442015053
- Artikelgewicht
- 929 Gramm
The Mechanics of Solder Alloy Interconnects is a resource to be used in developing a solder joint reliability assessment. Each chapter is written to be used as a stand-alone resource for a particular aspect of materials and modeling issues. With this gained understanding, the reader in search of a solution to a solder joint reliability problem knows where in the materials and modeling communities to go for the appropriate answer.
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Über die Autorin bzw. den Autor
John H. Lau, Ph.D., P.E., from July 2019 to June 2021, was the CTO of Unimicron, Taoyuan, Taiwan, where he has been a Senior Special Project Assistant since July 2021. Prior to that, he was a Senior Scientist/MTS with the Hewlett-Packard Laboratory and Agilent, Palo Alto, CA, USA, for 20 years; the Director of the System Packaging Laboratory, Institute of Microelectronics, Singapore, for two years; a Visiting Professor with The Hong Kong University of Science and Technology, Hong Kong, for one year; a Specialist with the Industrial Technology Research Institute, Hsinchu, Taiwan, for five year; a senior technical advisor at ASM Pacific Technology in Hong Kong for five years. He earned a Ph.D. degree in theoretical and applied mechanics from the University of Illinois at Urbana-Champaign. With more than 40 years of R&D and manufacturing experience, he has authored or coauthored more than 530 peer-reviewed technical publications (385 are the principalinvestigator), invented more than 52 issued or pending US patents (31 are the principal inventor), and given more than 350 lectures/workshops/keynotes worldwide. He has authored or coauthored 23 textbooks on fan-out wafer-level packaging, 3D IC heterogeneous integration and packaging, TSV for 3D integration, advanced MEMS packaging, chiplet design and heterogeneous integrated packaging, reliability of 2D and 3D IC interconnects, flip chip, WLP, MCM, area-array packages, WLCSP, high-density PCB, SMT, DCA, TAB, lead-free materials, soldering, manufacturing, and solder joint reliability.
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