On-Line Testing for VLSI

Michael Nicolaidis

ISBN 10: 1441950338 / ISBN 13: 9781441950338

Verlag: Springer US Dez 2010, 2010

Beschreibung

This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.

Bestandsnummer des Verkäufers 9781441950338

Bibliografische Details

• Titel: On-Line Testing for VLSI
• Verlag: Springer US Dez 2010
• Erscheinungsjahr: 2010
• Sprache: Englisch
• ISBN-10: 1441950338
• ISBN-13: 9781441950338
• Einband: Taschenbuch
• Zustand: Neu
• Abmessungen: 254B x 178 H x 10 T Millimeter Breite: 254 mm, Höhe: 178 mm, Tiefe: 10 mm
• Gewicht: 322 Gramm

Über diesen Titel

Inhaltsangabe

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.