On-Line Testing for VLSI

Michael Nicolaidis

ISBN 10: 0792381327 / ISBN 13: 9780792381327

Verlag: Springer US, Springer US Apr 1998, 1998

Beschreibung

This item is printed on demand - Print on Demand Titel. Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 168 pp. Englisch.

Bestandsnummer des Verkäufers 9780792381327

Bibliografische Details

• Titel: On-Line Testing for VLSI
• Verlag: Springer US, Springer US Apr 1998
• Erscheinungsjahr: 1998
• Sprache: Englisch
• ISBN-10: 0792381327
• ISBN-13: 9780792381327
• Einband: Buch
• Zustand: Neu
• Abmessungen: 260B x 183 H x 14 T Millimeter Breite: 260 mm, Höhe: 183 mm, Tiefe: 14 mm
• Gewicht: 525 Gramm

Über diesen Titel

Inhaltsangabe

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.