265 pp., hardcover, minor library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Bestandsnummer des Verk�ufers ZB1221441

Verk�ufer kontaktieren

Diesen Artikel melden

Bibliografische Details

Titel: Particle Characterization in Technology: Volume II: Morphological Analysis
Verlag: Crc Pr I Llc
Erscheinungsjahr: 1984
Sprache: Englisch
ISBN-10: 0849357853
ISBN-13: 9780849357855
Einband: Hardcover
Zustand: Very Good

�ber diesen Titel

Inhaltsangabe

Book by Beddow John Keith

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Anbieterinformationen

Zubal Books is the #1 buyer and seller of scholarly and rare books in America. Since 1961 we've handled thousands of private and technical libraries. Our family business knows books and we treat our clients with top-notch customer service. If you have any questions about our listings, please don't hesitate to contact us. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country

Zur Homepage des Verk�ufers

Unternehmensdaten des Verk�ufers

Zubal Books
2969 West 25th Street, Cleveland, OH, 44113, U.S.A.

Gesch�ftsbedingungen und Versandinformationen

Verkaufsbedingungen

Price are net to all
Visa/MC/Check/Money Order
Libraries Invoiced

We do accept checks, however
WE DO NOT HOLD OR RESERVE ANY ITEMS

All international postal rates are subject to change depending on weight
and size.

Versandbedingungen

Orders usually ship within 2 business days. Shipping costs are based on books
weighing 2.2 LB, or 1 KG. If your book order is heavy or oversized, we may
contact
you to let you know extra shipping is required.

Buyer is responsible for any additional duties, taxes, or fees required by recipient's country

Impressum & Info zum Verk�ufer