Pattern Recognition With Support Vector Machines : First International Workshop, Svm 2002, Niagara Falls, Canada, August 10, 2002 : Proceedings

Svm 200 (2002 Niagara Falls, Ont.); Verri, Alessandro (EDT); Lee, Seong-Whan (EDT)

ISBN 10: 354044016X / ISBN 13: 9783540440161

Verlag: Springer, 2002

Beschreibung

Unread book in perfect condition.

Bestandsnummer des Verkäufers 986448

Bibliografische Details

• Titel: Pattern Recognition With Support Vector Machines : First International Workshop, Svm 2002, Niagara Falls, Canada, August 10, 2002 : Proceedings
• Verlag: Springer
• Veröffentlichungsdatum: 2002
• Sprache: Englisch
• ISBN-10: 354044016X
• ISBN-13: 9783540440161
• Bindung: Softcover
• Zustand: As New

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Inhaltsangabe

With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over?t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.