Titel: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
Verlag: Springer
Erscheinungsjahr: 2003
Sprache: Englisch
ISBN-10: 140207235X
ISBN-13: 9781402072352
Einband: Hardcover
Zustand: New

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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