A Probabilistic Theory of Pattern Recognition

Luc Devroye

ISBN 10: 0387946187 / ISBN 13: 9780387946184

Verlag: Springer New York, Springer New York, 1996

Beschreibung

Druck auf Anfrage Neuware - Printed after ordering - Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material. Bestandsnummer des Verkäufers 9780387946184

Bibliografische Details

Titel: A Probabilistic Theory of Pattern Recognition

Verlag: Springer New York, Springer New York

Erscheinungsdatum: 1996

Einband: Buch

Zustand: Neu

Über diesen Titel

Inhaltsangabe:

A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.

Von der hinteren Coverseite:

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, tree classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.