Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.

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A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.

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