Titel: Proceedings: First Asian Test Symposium (Ats'92 November 26-27, 1992, Hiroshima, Japan) Institute of Electrical and Electronics Engineers
Verlag: IEEE Computer Society
Erscheinungsjahr: 1992
Sprache: Englisch
ISBN-10: 0818629851
ISBN-13: 9780818629853
Einband: Paperback
Zustand: Used: Good

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Seventy-three contributors from 12 countries in Asia, Europe, and North America demonstrate a strong interest in the field of test and design technologies. Discussions include fault simulation, one-line testing, diagnostics, and testability techniques. The symposium was held in Hiroshima, Japan, November 1992. No index. Annotation copyright Book News, Inc. Portland, Or.

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