Protocol Test Systems : 7th Workshop 7th Ifip Wg 6.1 International Workshop on Protocol Text Systems

Mizuno, Tadanori (EDT); Higashino, Teruo (EDT); Shiratori, Norio (EDT)

ISBN 10: 1475763107 / ISBN 13: 9781475763102

Verlag: Springer, 2013

Beschreibung

Bestandsnummer des Verkäufers 20346834-n

Bibliografische Details

• Titel: Protocol Test Systems : 7th Workshop 7th Ifip Wg 6.1 International Workshop on Protocol Text Systems
• Verlag: Springer
• Erscheinungsjahr: 2013
• Sprache: Englisch
• ISBN-10: 1475763107
• ISBN-13: 9781475763102
• Einband: Softcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

This book presents the latest research results in protocol testing. It contains the complete proceedings of the seventh Ifip Wg6.1 International Workshop on Protocol Test Systems (Iwpts '94), organized by the International Federation for Information Processing and held in Tokyo, Japan in November 1994. The book presents an alliance between research and industry and between the theory and practice of testing of data communication systems.

Reseña del editor

This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.