Protocol Test Systems

. Ed(s): Mizuno, Tadanori; Higashino, Teruo; Shiratori, Norio

ISBN 10: 0412711605 / ISBN 13: 9780412711602

Verlag: Chapman and Hall, 1995

Presents the research results in protocol testing. This book contains the proceedings of the seventh IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS '94), organized by the International Federation for Information Processing and held in Tokyo, Japan in November 1994. Editor(s): Mizuno, Tadanori; Higashino, Teruo; Shiratori, Norio. Series: IFIP Advances in Information and Communication Technology. Num Pages: 358 pages, biography. BIC Classification: PHDS; UTP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 234 x 156 x 20. Weight in Grams: 1500. . 1995. Hardback. . . . . Books ship from the US and Ireland. Bestandsnummer des Verkäufers V9780412711602

Inhaltsangabe:

This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.

Bibliografische Details

Titel: Protocol Test Systems
Verlag: Chapman and Hall
Erscheinungsdatum: 1995
Einband: Hardcover
Zustand: New