Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Chandra Shakher Pathak (u. a.)

ISBN 10: 1839682299 / ISBN 13: 9781839682292

Verlag: IntechOpen, 2022

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization | Chandra Shakher Pathak (u. a.) | Buch | Gebunden | Englisch | 2022 | IntechOpen | EAN 9781839682292 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu Print on Demand. Bestandsnummer des Verkäufers 121145061

Inhaltsangabe:

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Bibliografische Details

Titel: Recent Developments in Atomic Force ...
Verlag: IntechOpen
Erscheinungsdatum: 2022
Einband: Buch
Zustand: Neu