Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

Deshayes, Yannick; Bechou, Laurent

ISBN 10: 1785481525 / ISBN 13: 9781785481529

Verlag: ISTE Press - Elsevier, 2016

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Bibliografische Details

• Titel: Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation
• Verlag: ISTE Press - Elsevier
• Erscheinungsjahr: 2016
• Sprache: Englisch
• ISBN-10: 1785481525
• ISBN-13: 9781785481529
• Einband: Hardcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

Über die Autorinnen und Autoren

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.