Research for Practical Issues and Solutions in Computerized Multistage Testing

Yan, Duanli (EDT); Von Davier, Alina (EDT); Weiss, David (EDT)

ISBN 10: 0367207818 / ISBN 13: 9780367207816

Verlag: Routledge, 2024

Beschreibung

Bestandsnummer des Verkäufers 47847601-n

Bibliografische Details

• Titel: Research for Practical Issues and Solutions in Computerized Multistage Testing
• Verlag: Routledge
• Erscheinungsjahr: 2024
• Sprache: Englisch
• ISBN-10: 0367207818
• ISBN-13: 9780367207816
• Einband: Softcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST).

Über die Autorin bzw. den Autor

Duanli Yan is a Director of Computational Research at Educational Testing Services, Princeton, New Jersey, USA. She is also an adjunct professor at Rutgers University and Fordham University and has extensive experience in innovative psychometric research and development. She has published many books and received many awards, including the 2016 AERA D Significant Contribution to Educational Measurement and Research Methodology Award, and the 2022 and 2023 NCME Bradley Hanson Award.

Alina A. von Davier is the Chief of Assessment at Duolingo, Pittsburgh, Pennsylvania, USA. She leads the Duolingo English Test research and development area. She is a researcher in computational psychometrics, machine learning, and education. Von Davier is an innovator and an executive leader with over 20 years of experience in EdTech and in the assessment industry. In 2022, she joined the University of Oxford as an Honorary Research Fellow, and Carnegie Mellon University as a Senior Research Fellow.

David J. Weiss is a Professor of Psychology at University of Minnesota, Minnesota, USA. He has been continuously active in computerized adaptive testing (CAT) research since 1970, including hosting six international CAT conferences. He co-founded the International Association for Computerized Adaptive Testing, the Assessment Systems Corporation, and the Insurance Testing Corporation and was the founding editor of Applied Psychological Measurement and the Journal of Computerized Adaptive Testing.