Secondary Ion Mass Spectrometry: Principles and Applications

J.C. Vickerman, Nicola M. Reed, etc. et Alan Brown

ISBN 10: 019855625X / ISBN 13: 9780198556251

Verlag: Clarendon Press, 1989

Beschreibung

Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Salissures sur la tranche. Edition 1989. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Stains on the edge. Edition 1989. Ammareal gives back up to 15% of this item's net price to charity organizations.

Bestandsnummer des Verkäufers D-460-359

Bibliografische Details

• Titel: Secondary Ion Mass Spectrometry: Principles and Applications
• Verlag: Clarendon Press
• Erscheinungsjahr: 1989
• Sprache: Englisch
• ISBN-10: 019855625X
• ISBN-13: 9780198556251
• Einband: Hardcover
• Zustand: Bon

Über diesen Titel

Inhaltsangabe

Secondary ion mass spectrometry is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. This book attempts to provide an overview of the phenomenology, technology and application of this method as a technique for materials analysis. The text explains the basic physical and chemical principles and introduces theories which have been developed to explain the process. It also covers emergent techniques such as sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. The author outlines the practical benefits and pitfalls which may arise and features many practical examples to illustrate the application of secondary ion mass spectrometry to real problems.