Self-Checking and Fault-Tolerant Digital Design (The Morgan Kaufmann Series in Computer Architecture and Design)

Lala, Parag K.

ISBN 10: 0124343708 / ISBN 13: 9780124343702

Verlag: Morgan Kaufmann, 2000

Beschreibung

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Bestandsnummer des Verkäufers Scanned0124343708

Bibliografische Details

• Titel: Self-Checking and Fault-Tolerant Digital Design (The Morgan Kaufmann Series in Computer Architecture and Design)
• Verlag: Morgan Kaufmann
• Erscheinungsjahr: 2000
• Sprache: Englisch
• ISBN-10: 0124343708
• ISBN-13: 9780124343702
• Einband: Hardcover
• Zustand: new

Über diesen Titel

Inhaltsangabe

With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems.

Über die Autorin bzw. den Autor

The author is currently a Professor in the Department of Electrical Engineering at North Carolina A&T State University. He is the author of more than 75 papers, and three books published by Prentice Hall. His research interests include design for testability, self-checking logic design, automatic logic synthesis of low power logic circuits, andCPLD/FPGA based system design. He received a M.S. from King's College, London, and a Ph.D. from the City University of London.