Semiconductor Interfaces, Microstructures and Devices: Properties and applications

Feng, Zhe Chuan

ISBN 10: 0750301805 / ISBN 13: 9780750301800

Verlag: CRC Press, 1993

Beschreibung

Most items will be dispatched the same or the next working day. An apparently unread copy in perfect condition. Dust cover is intact with no nicks or tears. Spine has no signs of creasing. Pages are clean and not marred by notes or folds of any kind.

Bestandsnummer des Verkäufers wbs1946231496

Bibliografische Details

• Titel: Semiconductor Interfaces, Microstructures and Devices: Properties and applications
• Verlag: CRC Press
• Erscheinungsjahr: 1993
• Sprache: Englisch
• ISBN-10: 0750301805
• ISBN-13: 9780750301800
• Einband: Hardcover
• Zustand: Like New

Über diesen Titel

Inhaltsangabe

A semiconductor interface is the contact between the semiconductor itself and a metal. The interface is a site of change, and it is imperative to ensure that the semiconducting material is sealed at this point to maintain its reliability. This book examines various aspects of interfaces, showing how they can affect microstructures and devices such as infrared photodetectors (as used in nightsights) and blue diode lasers. It presents various techniques for examining different types of semiconductor material and suggests future potential commercial applications for different semiconductor devices. Written by experts in their fields and focusing on metallic semiconductors (Cadmium Telluride and related compounds), this comprehensive overview of recent developments is an essential reference for those working in the semiconductor industry and provides a concise and comprehensive introduction to those new to the field.

Críticas

"The selection of material is excellent...very interesting, focussed on important issues and with rather informal presentation of crucial ideas and problems...of value for graduates in this discipline...individual articles contain elementary introductions and may be accessible to students in their final year." --E M Goldys, Vol 31, 1/2 January/February 1994