Spectrum and Network Measurements

Witte, Robert A.

ISBN 10: 1884932169 / ISBN 13: 9781884932168

Verlag: SciTech Publishing, 2001

Beschreibung

Book is in very good condition and may include minimal underlining highlighting. The book can also include "From the library of" labels. May not contain miscellaneous items toys, dvds, etc. . We offer 100% money back guarantee and 24 7 customer service.

Bestandsnummer des Verkäufers ZEV.1884932169.VG

Bibliografische Details

• Titel: Spectrum and Network Measurements
• Verlag: SciTech Publishing
• Erscheinungsjahr: 2001
• Sprache: Englisch
• ISBN-10: 1884932169
• ISBN-13: 9781884932168
• Einband: Hardcover
• Zustand: very_good

Über diesen Titel

Inhaltsangabe

This book covers the theory and practice of spectrum and network measurements in electronic systems. Intended for readers who have a background in electrical engineering and use spectrum or network analyzers to characterize electronic signals or systems, this classic volume successfully consolidates the pertinent theory into one comprehensive treatment of frequency domain measurements. Witte's thorough coverage of critical concepts, such as Fourier analysis, transmission lines, intermodulation distortion, signal-to-noise ratio and S-parameters enables the reader to understand the basic theory of signals and systems, relate it to measured results, and apply it when creating new designs.

Über die Autorin bzw. den Autor

Bob Witte is originally from Indiana and received a BSEE degree from Purdue University in 1978. He joined Hewlett-Packard Company that same year and has spent his career working in the area of electronic test instruments, first with HP and later with Agilent Technologies. Bob has contributed to the development of spectrum analyzers, network analyzers and digital oscilloscopes and has two patents relating to that work. While working at HP, he received an MSEE degree from Colorado State University in Fort Collins, Colorado. Recently, he received a master's degree in Management of Technology (MSMOT) from the National Technological University.