The Statistical Analysis of Spatial Pattern

M. S. Bartlett

ISBN 10: 9400957572 / ISBN 13: 9789400957572

Verlag: Springer Netherlands, Springer Netherlands Nov 2013, 2013

Beschreibung

This item is printed on demand - Print on Demand Titel. Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 104 pp. Englisch.

Bestandsnummer des Verkäufers 9789400957572

Bibliografische Details

• Titel: The Statistical Analysis of Spatial Pattern
• Verlag: Springer Netherlands, Springer Netherlands Nov 2013
• Erscheinungsjahr: 2013
• Sprache: Englisch
• ISBN-10: 9400957572
• ISBN-13: 9789400957572
• Einband: Taschenbuch
• Zustand: Neu

Über diesen Titel

Inhaltsangabe

In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.