Statistical Regression with Measurement Error: Kendall's Library of Statistics 6

Cheng, Chi-Lun; Van Ness, John W.

ISBN 10: 047071106X / ISBN 13: 9780470711064

Verlag: Wiley, 2010

Beschreibung

In.

Bestandsnummer des Verkäufers ria9780470711064_new

Bibliografische Details

• Titel: Statistical Regression with Measurement Error: Kendall's Library of Statistics 6
• Verlag: Wiley
• Erscheinungsjahr: 2010
• Sprache: Englisch
• ISBN-10: 047071106X
• ISBN-13: 9780470711064
• Einband: Hardcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Über die Autorin bzw. den Autor

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.