Titel: Structural Analysis in Microelectronic and Fiber-Optic Systems: Volume I Basic Principles of Engineering Elastictiy and Fundamentals of Structural Analysis
Verlag: Van Nostrand Reinhold
Erscheinungsjahr: 1991
Sprache: Englisch
ISBN-10: 0442207719
ISBN-13: 9780442207717
Einband: Hardcover
Zustand: Very Good
Zustand des Schutzumschlags: No Jacket

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Inhaltsangabe

Suhir applies methods of classical structural mechanics to various mechanical problems in microelectronics and fiber optics, emphasizing packaging problems and analytical modeling of the mechanical behavior of materials and structures used. Vol. 1 focuses on the theoretical underpinnings of structural analysis methods, while paving the way toward applications to particular engineering problems. The planned vol. 2 will expand on the applications of the theoretical principles. Annotation copyright Book News, Inc. Portland, Or.

Rese�a del editor

This book contains the fundamentals of a discipline, which could be called Structural Analysis in Microelectronics and Fiber Optics. It deals with mechanical behavior of microelectronic and fiber-optic systems and is written in response to the crucial need for a textbook for a first in-depth course on mechanical problems in microelectronics and fiber optics. The emphasis of this book is on electronic and optical packaging problems, and analytical modeling. This book is apparently the first attempt to select, advance, and present those methods of classical structural mechanics which have been or can be applied in various stress-strain problems encountered in "high technology" engineering and some related areas, such as materials science and solid-state physics. The following major objectives are pursued in Structural Analysis in Microelectronic and Fiber-Optic Systems: Identify structural elements typical for microelectronic and fiber-optic systems and devices, and introduce the student to the basic concepts of the mechanical behavior of microelectronic and fiber-optic struc� tures, subjected to thermally induced or external loading. Select, advance, and present methods for analyzing stresses and deflections developed in microelectronic and fiber-optic structures; demonstrate the effectiveness of the methods and approaches of the classical struc� tural analysis in the diverse mechanical problems of microelectronics and fiber optics; and give students of engineering, as well as practicing engineers and designers, a thorough understanding of the main princi� ples involved in the analytical evaluation of the mechanical behavior of microelectronic and fiber-optic systems.

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