THIN FILMS: STRESSES AND MECHANICAL PROPERTIES IX

CENGIZ S. OZKAN, UNIVERSITY OF CALIFORNIA, RIVERSIDEL. BEN FREUND, BROWN UNIVERSITY, RHODE ISLANDROBERT C. CAMMARATA, THE JOHNS HOPKINS UNIVERSITYHUAJIAN GAO, MAX-PLANCK-INSTITUT FüR METALLFORSCHUNG, GERMANY

ISBN 10: 1558996311 / ISBN 13: 9781558996311

Verlag: Cambridge University Press, 2002

Beschreibung

New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Bestandsnummer des Verkäufers ABEJUNE24-189471

Bibliografische Details

• Titel: THIN FILMS: STRESSES AND MECHANICAL PROPERTIES IX
• Verlag: Cambridge University Press
• Erscheinungsjahr: 2002
• Sprache: Englisch
• ISBN-10: 1558996311
• ISBN-13: 9781558996311
• Einband: Hardcover
• Zustand: Brand New

Über diesen Titel

Inhaltsangabe

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Reseña del editor

This book, the ninth in a popular series from the Materials Research Society, is strengthened by invited and contributed papers covering a wide range of subjects, from processing-microstructure-mechanical property relationships, strain effects and self-organization in thin films, nanoscale defects and thermomechanical behavior of materials, to novel nanscale materials testing. While the collection continues the series theme of materials science related modeling and characterization of mechanical properties of materials, special focus is given to: strain relaxation and strengthening mechanisms; defects formation; mechanical properties and nanoscale testing; adhesion and fracture; thin-film applications in MEMS; computational modeling and experiments; and film deposition, microstructure, evolution and intrinsic stress.