Test Generation for VLSI Chips

Agrawal, Vishwani; Seth, Sharad C.

ISBN 10: 081868786X / ISBN 13: 9780818687860

Verlag: Computer Society Press, 1988

Beschreibung

hardcover in very good + condition.

Bestandsnummer des Verkäufers 600383

Bibliografische Details

• Titel: Test Generation for VLSI Chips
• Verlag: Computer Society Press
• Erscheinungsjahr: 1988
• Sprache: Englisch
• ISBN-10: 081868786X
• ISBN-13: 9780818687860
• Einband: Hardcover
• Zustand: Very Good
• Verkäuferkataloge:
  • computers

Über diesen Titel

Inhaltsangabe

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.

Reseña del editor

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.