X-Ray and Neutron Reflectivity: Principles and Applications (Lecture Notes in Physics Monographs, 58)

Jean Daillant et Alain Gibaud

ISBN 10: 3540661956 / ISBN 13: 9783540661955

Verlag: Springer, 1999

Beschreibung

Ancien livre de bibliothèque. Edition 1999. Tome 58. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 1999. Volume 58. Ammareal gives back up to 15% of this item's net price to charity organizations.

Bestandsnummer des Verkäufers F-918-041

Bibliografische Details

• Titel: X-Ray and Neutron Reflectivity: Principles and Applications (Lecture Notes in Physics Monographs, 58)
• Verlag: Springer
• Erscheinungsjahr: 1999
• Sprache: Englisch
• ISBN-10: 3540661956
• ISBN-13: 9783540661955
• Einband: Hardcover
• Zustand: Très bon

Über diesen Titel

Inhaltsangabe

An introduction to x-ray and neutron reflectivity techniques. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. Th e approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students.

Von der hinteren Coverseite

The book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students.