Yield and Variability Optimization of Integrated Circuits
Zhang, Jian Cheng; Styblinski, M. A.
ISBN 10: 146135935X ISBN 13: 9781461359357
Verlag: Springer-Verlag New York Inc., 1995
Neu
Softcover
Verkäufer
Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irland
Verkäuferbewertung 5 von 5 Sternen
AbeBooks-Verkäufer seit 27. Februar 2001
Dieser Artikel ist nicht mehr verfügbar.
Beschreibung
Beschreibung:
Num Pages: 234 pages, biography. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 397. . 1995. Softcover reprint of the original 1st ed. 1995. Paperback. . . . . Bestandsnummer des Verkäufers V9781461359357
Inhaltsangabe:
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Bibliografische Details
Titel: Yield and Variability Optimization of ...
Verlag: Springer-Verlag New York Inc.
Erscheinungsdatum: 1995
Einband: Softcover
Zustand: New
Beste Suchergebnisse bei AbeBooks
Foto des Verkäufers
Yield and Variability Optimization of Integrated Circuits
Print-on-DemandAnbieter: moluna, Greven, Deutschland
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft. Bestandsnummer des Verkäufers 4194146
Neu kaufen
EUR 92,27
EUR 48,99 Versand
Versand von Deutschland nach USA
Versand von Deutschland nach USA
Anzahl: Mehr als 20 verfügbar
Yield and Variability Optimization of Integrated Circuits
Print-on-DemandAnbieter: preigu, Osnabrück, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Yield and Variability Optimization of Integrated Circuits | M. A. Styblinski (u. a.) | Taschenbuch | xvii | Englisch | 2012 | Springer US | EAN 9781461359357 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Bestandsnummer des Verkäufers 105997859
Neu kaufen
EUR 95,70
EUR 70,00 Versand
Versand von Deutschland nach USA
Versand von Deutschland nach USA
Anzahl: 5 verfügbar
Beispielbild für diese ISBN
Yield and Variability Optimization of Integrated Circuits
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. Bestandsnummer des Verkäufers ABLIING23Mar2716030032611
Neu kaufen
EUR 103,01
EUR 3,43 Versand
Versand innerhalb von USA
Versand innerhalb von USA
Anzahl: Mehr als 20 verfügbar
Foto des Verkäufers
Yield and Variability Optimization of Integrated Circuits
Verlag:
Springer US, Springer New York Nov 2012, 2012
ISBN 10: 146135935X
ISBN 13: 9781461359357
Neu
Taschenbuch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 256 pp. Englisch. Bestandsnummer des Verkäufers 9781461359357
Neu kaufen
EUR 106,99
EUR 60,00 Versand
Versand von Deutschland nach USA
Versand von Deutschland nach USA
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Yield and Variability Optimization of Integrated Circuits
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. In. Bestandsnummer des Verkäufers ria9781461359357_new
Neu kaufen
EUR 112,39
EUR 13,82 Versand
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: Mehr als 20 verfügbar
Beispielbild für diese ISBN
Yield and Variability Optimization of Integrated Circuits
Anbieter: Chiron Media, Wallingford, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
PF. Zustand: New. Bestandsnummer des Verkäufers 6666-IUK-9781461359357
Neu kaufen
EUR 112,63
EUR 17,86 Versand
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: 10 verfügbar
Foto des Verkäufers
Yield and Variability Optimization of Integrated Circuits
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters. Bestandsnummer des Verkäufers 9781461359357
Neu kaufen
EUR 112,77
EUR 61,97 Versand
Versand von Deutschland nach USA
Versand von Deutschland nach USA
Anzahl: 1 verfügbar
Foto des Verkäufers
Yield and Variability Optimization of Integrated Circuits
Print-on-DemandAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters. 256 pp. Englisch. Bestandsnummer des Verkäufers 9781461359357
Neu kaufen
EUR 160,49
EUR 23,00 Versand
Versand von Deutschland nach USA
Versand von Deutschland nach USA
Anzahl: 2 verfügbar
Beispielbild für diese ISBN
Yield and Variability Optimization of Integrated Circuits
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Paperback. Zustand: Like New. Like New. book. Bestandsnummer des Verkäufers ERICA800146135935X6
Gebraucht kaufen
EUR 162,73
EUR 28,83 Versand
Versand von Vereinigtes Königreich nach USA
Versand von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar