Verlag: LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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Verlag: LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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Verlag: LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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In den WarenkorbTaschenbuch. Zustand: Neu. Fault-Mitigation Strategies for Reliable FPGA Architecture | Chagun Basha Basheer Ahmed | Taschenbuch | 176 S. | Englisch | 2016 | LAP LAMBERT Academic Publishing | EAN 9783659917028 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.
Verlag: LAP LAMBERT Academic Publishing Jul 2016, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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In den WarenkorbTaschenbuch. Zustand: Neu. Neuware -Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high¿density functionality, high performance and low¿cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today¿s commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation¿hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low¿cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design.Books on Demand GmbH, Überseering 33, 22297 Hamburg 176 pp. Englisch.
Verlag: LAP LAMBERT Academic Publishing Jul 2016, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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In den WarenkorbTaschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high-density functionality, high performance and low-cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today's commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation-hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low-cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design. 176 pp. Englisch.
Verlag: LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Basheer Ahmed Chagun BashaB. Chagun Basha is a research fellow in the field of fault-tolerant computing and reliable computer architectures. He was associated with CNRS-IETR (Nantes) and INRIS-IRISA (Lannion), France. Prior to that, .
Verlag: LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659917028 ISBN 13: 9783659917028
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In den WarenkorbTaschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high-density functionality, high performance and low-cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today's commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation-hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low-cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design.