Sprache: Englisch
Verlag: Academic Press, Inc., a subsidiary of Harcourt, Btace, Jovanovich, Publishers, New York - San Francisco - London, 1978
ISBN 10: 0122413601 ISBN 13: 9780122413605
Anbieter: Cat's Curiosities, Pahrump, NV, USA
Erstausgabe
Hardcover. Zustand: As New. Zustand des Schutzumschlags: Near Fine. 1st Edition. One of a series of monographs edited by Yoh-Han Pao and Paul Kelley. Numerous contributors including A. Luxmoore of the University College of Swansea and A. Tiziani of Wild Heerbrugg Ltd., Heerbrugg, Switzerland. Mr. Erf was of the United Technologies Research Center, East Hartford, Conn. Surface Roughness Measurement; Displacement and Strain Measurement; Vibration Analysis and Deformation Measurement; Electronic Speckle Pattern Interferometry; Topological Speckle and Structures Inspection; Measurement of Crystal Length Changes; Measurement of Displacement Around Crack Tips, etc. On a nice coated stock, well illustrated with diagrams and B&W plates. 331 pp. including index. Reduced from $45.