Verlag: Heidelberg, Springer., 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
25 cm. XI, 256 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Springer Series in Materials Science, Vol. 193. Sprache: Englisch.
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
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ISBN 10: 3662519763 ISBN 13: 9783662519769
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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ISBN 10: 3642451519 ISBN 13: 9783642451515
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ISBN 10: 3662519763 ISBN 13: 9783662519769
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Zustand: New. pp. 270 124 Illus.(78 Col.).
Verlag: Springer Berlin Heidelberg, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Zustand: Sehr gut. Zustand: Sehr gut - Buchschnitt verkürzt - gepflegter, sauberer Zustand - Ausgabejahr 2014 | Seiten: 268 | Sprache: Englisch | Produktart: Bücher.
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Zustand: New. pp. 270 124 Illus.(78 Col.).
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Zustand: USED_VERYGOOD. Book is in Used-VeryGood condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain very limited notes and highlighting. 1.
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
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Verlag: Springer Berlin Heidelberg Aug 2016, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction. 268 pp. Englisch.
Verlag: Springer Berlin Heidelberg Apr 2014, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction. 268 pp. Englisch.
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
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Verlag: Springer Berlin Heidelberg, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Verlag: Springer Berlin Heidelberg, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Verlag: Springer Berlin Heidelberg, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: moluna, Greven, Deutschland
Zustand: NEW. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scientific status report on analytical techniques in nano-and surface sciencesPresentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-El.
Verlag: Springer Berlin Heidelberg, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
Anbieter: moluna, Greven, Deutschland
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scientific status report on analytical techniques in nano-and surface sciencesPresentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-El.
Verlag: Springer Verlag, 2016
ISBN 10: 3662519763 ISBN 13: 9783662519769
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Paperback. Zustand: NEW. reprint edition. 268 pages. 9.25x6.10x0.63 inches. In Stock.
Verlag: Springer Verlag, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: NEW. 2014 edition. 256 pages. 9.75x6.50x0.75 inches. In Stock.
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irland
Zustand: New. In-Situ Materials Characterization Editor(s): Ziegler, Alexander; Graafsma, Heinz; Zhang, Xiao-Feng; Frenken, J.W.M. Series: Springer Series in Materials Science. Num Pages: 267 pages, 46 black & white illustrations, 78 colour illustrations, biography. BIC Classification: PNFS; TBN; TGMT. Category: (P) Professional & Vocational. Dimension: 164 x 241 x 19. Weight in Grams: 546. . 2014. 2014th Edition. Hardcover. . . . .
Verlag: Springer, 2014
ISBN 10: 3642451519 ISBN 13: 9783642451515
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. In-Situ Materials Characterization Editor(s): Ziegler, Alexander; Graafsma, Heinz; Zhang, Xiao-Feng; Frenken, J.W.M. Series: Springer Series in Materials Science. Num Pages: 267 pages, 46 black & white illustrations, 78 colour illustrations, biography. BIC Classification: PNFS; TBN; TGMT. Category: (P) Professional & Vocational. Dimension: 164 x 241 x 19. Weight in Grams: 546. . 2014. 2014th Edition. Hardcover. . . . . Books ship from the US and Ireland.