ISBN: 9780471584896 - electromigration and electronic device degradation (23 Ergebnisse)

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hardcover. Zustand: Very Good. very clean Wiley hardcover no jacket. no marks. clean text. solid binding. very light wear. ISBN matches listing Fast service with confirmation, no international or priority orders over 4lbs.

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Zustand: New. In English.

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Hardback. Zustand: New. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.…

Zustand: New. pp. 344.

Zustand: New. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. Editor(s): Christou, Aris. Num Pages: 344 pages, black & white illustrations. BIC Classification: PHK; TGPR; TJK; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 236 x 165 x 26. Weight in Grams: 682. . 1993. 1st Edition. Hardcover. . . . .…

Zustand: New. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.&Uumlber den AutorAr.

Zustand: New. pp. 344.

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Hardback. Zustand: New. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.…

Hardcover. Zustand: Brand New. 1st edition. 343 pages. 9.75x6.50x0.75 inches. In Stock.

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Buch. Zustand: Neu. Neuware - Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.…

Zustand: New. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. Editor(s): Christou, Aris. Num Pages: 344 pages, black & white illustrations. BIC Classification: PHK; TGPR; TJK; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 236 x 165 x 26. Weight in Grams: 682. . 1993. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Zustand: new. Hardcover. Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Hardcover. Zustand: Brand New. 1st edition. 343 pages. 9.75x6.50x0.75 inches. In Stock. This item is printed on demand.