Sprache: Englisch
Verlag: Kluwer Academic Publishers, Dordrecht, 2001
ISBN 10: 0792392965 ISBN 13: 9780792392965
Anbieter: Florida Mountain Book Co., Datil, NM, USA
Zustand: Very Good+. Hardcover, [xvi], 225 pages. Very Good+ condition. Second printing. Size 9.5"x6.25". Chapter headings: 1 - PCB Testing; 2 - The Boundary-Scan Test Standard; 3 - Hardware Test Innovations; 4 - BST Design Languages; 5 - PCB Test Strategy Backgrounds; 6 - Management Aspects. Includes Appendix, Glossary, References, and Index. Book has light exterior handling/shelfwear, else Fine condition, clean and unmarked.
EUR 7,28
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965.
EUR 13,68
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965.
Anbieter: Bay State Book Company, North Smithfield, RI, USA
Zustand: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
Perfect Paperback. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Zustand: Gut. Auflage: 1993. 244 Seiten ex Library Book aus einer wissenschafltichen Bibliothek Sprache: Englisch Gewicht in Gramm: 545 24,7 x 16,5 x 2,1 cm, Broschiert.
perfect. Zustand: New. In shrink wrap. Looks like an interesting title!
Zustand: Good. Ältere Ausgabe. Auflage: 1993.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,57
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 164,55
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
EUR 180,29
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
EUR 180,88
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 181,87
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
Zustand: New. pp. 248.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, 1992
ISBN 10: 0792392965 ISBN 13: 9780792392965
Anbieter: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irland
Zustand: New. Provides an introduction and guidance to Boundary-Scan testing. This book is suitable for IC design and test engineers, and engineering managers. Num Pages: 225 pages, biography. BIC Classification: TJF; UY. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 235 x 155 x 13. Weight in Grams: 780. . 1992. Hardback. . . . .
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, 1992
ISBN 10: 0792392965 ISBN 13: 9780792392965
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Provides an introduction and guidance to Boundary-Scan testing. This book is suitable for IC design and test engineers, and engineering managers. Num Pages: 225 pages, biography. BIC Classification: TJF; UY. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 235 x 155 x 13. Weight in Grams: 780. . 1992. Hardback. . . . . Books ship from the US and Ireland.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 226,84
Anzahl: 1 verfügbar
In den WarenkorbPerfect Paperback. Zustand: Like New. Like New. book.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level. 244 pp. Englisch.
Anbieter: moluna, Greven, Deutschland
EUR 136,16
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through whi.
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Boundary-Scan Test | A Practical Approach | Harry Bleeker (u. a.) | Buch | xvi | Englisch | 1992 | Springer | EAN 9780792392965 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 218,92
Anzahl: 4 verfügbar
In den WarenkorbZustand: New. Print on Demand pp. 248 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Sprache: Englisch
Verlag: Springer US, Springer Dez 1992, 1992
ISBN 10: 0792392965 ISBN 13: 9780792392965
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Buch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. PRINT ON DEMAND pp. 248.