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Verlag: Springer, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Hardcover. Zustand: new.
Verlag: Springer, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Buch Print-on-Demand
Zustand: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Verlag: Springer New York Mrz 2012, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing 192 pp. Englisch.
Verlag: Springer New York, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: moluna, Greven, Deutschland
Buch
Gebunden. Zustand: New.
Verlag: Springer New York, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Verlag: Springer-Verlag New York Inc., 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
Buch Print-on-Demand
Hardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Verlag: Springer, 2012
ISBN 10: 146142190XISBN 13: 9781461421900
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Hardcover. Zustand: Like New. Like New. book.