ISBN: 9781493913480 - cmos test and evaluation: a physical perspective (14 Ergebnisse)

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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.…

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Hardcover. Zustand: Brand New. 437 pages. 9.50x6.50x1.25 inches. In Stock.

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Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Relates CMOS product performance to basic physical models of transistors and passive elementsUses embedded test structures and sensors for product test debug, yield and performance evaluationDescribes impact of device variabilityDisc.…

Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. 440 pp. Englisch. …

Buch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 440 pp. Englisch.…

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