Sprache: Englisch
Verlag: Kogan Page Science, London and Sterling, VA, 2002
ISBN 10: 1903996600 ISBN 13: 9781903996607
Anbieter: Smith Family Bookstore Downtown, Eugene, OR, USA
Trade Paperback. Zustand: Good. text clean and unmarked. binding cracked, no loose pages. spine has some creases. covers have light wear. edges of pages have light wear.
Anbieter: Gareth Roberts, Rhydcymerau, Llandeilo, CARMS, Vereinigtes Königreich
EUR 17,82
Anzahl: 1 verfügbar
In den WarenkorbSoft cover. Zustand: Good. No Jacket. ex library paperback in plastic sleeve; usual stamps/markings. Published in 2004 by Kogan Page Science, London. A good, clean copy. All 19 plates intact, clean & free from markings. Ready for immediate despatch from UK. BS-1E*.
Sprache: Englisch
Verlag: Butterworth-Heinemann 2004-07-01, 2004
ISBN 10: 1903996600 ISBN 13: 9781903996607
Anbieter: Chiron Media, Wallingford, Vereinigtes Königreich
EUR 73,81
Anzahl: Mehr als 20 verfügbar
In den WarenkorbPaperback. Zustand: New.
EUR 85,19
Anzahl: 3 verfügbar
In den WarenkorbZustand: New. pp. 432.
EUR 82,14
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 395 pages. 9.00x6.00x1.25 inches. In Stock.
Zustand: New. pp. 432 1st Edition.
Zustand: New. pp. 432.
Sprache: Englisch
Verlag: Elsevier Science & Technology, 2004
ISBN 10: 1903996600 ISBN 13: 9781903996607
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
EUR 91,88
Anzahl: Mehr als 20 verfügbar
In den WarenkorbPaperback / softback. Zustand: New. New copy - Usually dispatched within 4 working days.
Taschenbuch. Zustand: Neu. Surfaces and Their Measurement | David J Whitehouse | Taschenbuch | Englisch | 2004 | Elsevier Science | EAN 9781903996607 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
Anbieter: Brook Bookstore On Demand, Napoli, NA, Italien
EUR 71,92
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: new. Questo è un articolo print on demand.
Sprache: Englisch
Verlag: Elsevier Science Jul 2004, 2004
ISBN 10: 1903996600 ISBN 13: 9781903996607
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation. 432 pp. Englisch.
Sprache: Englisch
Verlag: Elsevier Science & Technology|Butterworth-Heinemann, 2004
ISBN 10: 1903996600 ISBN 13: 9781903996607
Anbieter: moluna, Greven, Deutschland
EUR 78,65
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.