ISBN: 9782901483052 - large-angle convergent-beam electron diffraction applications to crystal defects (20 Ergebnisse)

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Zustand: New. A publication of the French Society of Microscopies, this book is devoted to an important aspect of electron diffraction. The description of convergent-beam electron diffraction and of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. Translator(s): Bres, Etienne. Num Pages: 376 pages, 1, black & white illustrations. BIC Classification: PNT. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 233 x 168 x 26. Weight in Grams: 622. . 2004. Paperback. . . . .…

Taschenbuch. Zustand: Neu. Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects | Jean-Paul Morniroli (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2004 | Routledge | EAN 9782901483052 | Verantwortliche Person für die EU: Taylor & Francis Verlag GmbH, Kaufingerstr. 24, 80331 München, gpsr[at]taylorandfrancis[dot]com | Anbieter: preigu. …

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Zustand: New. A publication of the French Society of Microscopies, this book is devoted to an important aspect of electron diffraction. The description of convergent-beam electron diffraction and of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. Translator(s): Bres, Etienne. Num Pages: 376 pages, 1, black & white illustrations. BIC Classification: PNT. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 233 x 168 x 26. Weight in Grams: 622. . 2004. Paperback. . . . . Books ship from the US and Ireland.…

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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed. 452 pp. Englisch. …

Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The author Jean- Paul Morniroli is a professor in the Ecole Nationale Superieure de Chimie of Lille: his research is performed in the Laboratoire de Metallurgie et Genie des Materiaux CNRS 8517 of the Universite des Sciences at Technologies de Lille. He is .…

Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.…